Web Seminar on Continuous Integration, January 23, 2007
Continuous Integrated Testing for .NET: What’s in it for You?
An SD Times Web Seminar
Tuesday, January 23 2007, 2:00 pm Eastern, 11:00 am Pacific
You already know that it’s better, faster and cheaper to fix bugs early in your application development cycles. But the last thing you need is more work in your busy day. Enter Continuous Integrated Testing (CIT), an approach that combines development and testing practices and tools to let you test while you build, increasing quality and saving you time.Author and industry analyst Ian Hayes, president of Clarity Consulting, will outline through pragmatic, quantifiable examples how developers, managers and executives can benefit from the use of CIT. Compuware CIT specialist Mike Koza will demonstrate how CIT can be easily and methodically integrated into a Microsoft-based development and testing organization, whether you’re using agile, traditional or hybrid methodologies.
Attendee Bonus: One Web Seminar attendee will receive an Apple iPod nano, courtesy of Compuware.
Speaker: Ian S. Hayes, Clarity Consulting:
Ian S. Hayes is the founder and president of Clarity Consulting, Inc. As an industry analyst and consultant, he actively advises Fortune 1000 companies on enhancing IT value by better targeting IT investments, improving the effectiveness of IT execution, and establishing measurement programs that tie IT performance to delivered business value. Hayes is the author of three IT books, has chaired numerous industry conferences, and has had articles and reports published in Computerworld, Information Week, Software Magazine and the Cutter IT Journal.
Speaker: Mike Koza, Compuware:
Mike Koza is a senior practitioner at Compuware supporting its application development and software quality solutions. He brings over 17 years of experience in the information technology space ranging from application development, project management and consulting with organizations that include Electronic Data Systems and Oakland County. He manages and consults on Compuware’s Continuous Integrated Testing solution for customers and events around the world.
Moderator: David Rubinstein, Editor-in-Chief, SD Times:
David Rubinstein brings more than 25 years of newspaper experience to his role as editor-in-chief of SD Times. Over the past six years, he has covered a wide range of software development issues, from the application development lifecycle to emerging standards and specifications, as well as the business behind the software business. Rubinstein writes a regular column in SD Times that examines the development industry as a whole.
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